These 1-day workshops are a unique opportunity to meet Alemnis, Imina, Nenovison and point electronic.

You will learn about existing in-situ solutions, including integrations for correlative in-situ SEM analysis (nanoindentation + electrical nanoprobing, electrical failure analysis, AFM-in-SEM, etc) and hear about applications from the users.

• Workshop at Covalent Metrology, Sunnyvale, CA. Apr 23, 9:00 am - 3:30 pm. See the program and abstracts here. Register here.
• Workshop at MIT.Nano, Boston, MA. Apr 25, 09:00 am - 14:30 pm. See the program here. Register here.

Both workshops are free. Number of participants is limited.